A previous poster chose to use the example of atomic force microscopy to illustrate the alleged inanity of my comment about measuring thrust plate flatness with light.
The cantilever deflection in atomic force microscopy is most widely measured with optical methods, either with an interferometer or the beam-bounce method. With beam bounce, an optical beam is reflected from the back side of the cantilever to a position-sensitive photodetector.
The cantilever deflection in atomic force microscopy is most widely measured with optical methods, either with an interferometer or the beam-bounce method. With beam bounce, an optical beam is reflected from the back side of the cantilever to a position-sensitive photodetector.